MSI MS-9652 Manual do Utilizador

Consulte online ou descarregue Manual do Utilizador para Medição, teste e controlo MSI MS-9652. CERTIFICATE [en] [fr] Manual do Utilizador

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No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C.
TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:service@quietek.com http://www.quietek.com
CERTIFICATE
Issued Date: Sep. 15, 2008
Report No.: 088213R–ITCEP07V04
This is to certify that the following designated product
Product : Notebook
Trade Name : MSI
Model Number
: MS-1674, EX620
Company Name
: MICRO-STAR INT’L Co., LTD.
This product, which has been issued the test report listed as above in QuieTek
Laboratory, is based on a single evaluation of one sample and confirmed to
comply with the requirements of the following EMC standard.
EN 55022: 2006 EN 55024: 1998+A1: 2001+A2: 2003
EN 61000-3-2:2006 IEC 61000-4-2 Edition 1.2: 2001-04
EN 61000-3-3:1995+A1: 2001+A2: 2005
IEC 61000-4-3 Edition 3.0: 2006
IEC 61000-4-4: 2004
IEC 61000-4-5 Edition 2.0: 2005
IEC 61000-4-6 Edition 2.2: 2006
IEC 61000-4-8 Edition 1.1: 2001-03
IEC 61000-4-11 Second Edition: 2004-03
TEST LABORATORY
Vincent Lin / Manager
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1 2 3 4 5 6 ... 133 134

Resumo do Conteúdo

Página 1 - CERTIFICATE

No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. TEL:+886-2-8601-3788 FAX:+886-2-8601-3789 Email:service@quiete

Página 2 - Test Report

Report No: 088213R-ITCEP07V04 Page: 7 of 131 1. General Information 1.1. EUT Description Product Name Notebook Trade Name MSI Model No. MS-16

Página 3 - Declaration of Conformity

Report No: 088213R-ITCEP07V04 Page: 97 of 131 9.6. Test Result Product Notebook Test Item Radiated susceptibility Test Mode Mode 1 Date of Te

Página 4 - Statement of Conformity

Report No: 088213R-ITCEP07V04 Page: 98 of 131 Product Notebook Test Item Radiated susceptibility Test Mode Mode 2 Date of Test 2008/08/27

Página 5 - Test Report Certification

Report No: 088213R-ITCEP07V04 Page: 99 of 131 9.7. Test Photograph Test Mode : Mode 1 Description : Radiated Susceptibility Test Setup Test Mode

Página 6 - Laboratory Information

Report No: 088213R-ITCEP07V04 Page: 100 of 131 10. Electrical Fast Transient/Burst 10.1. Test Specification According to Standard : IEC 61000-4-

Página 7 - TABLE OF CONTENTS

Report No: 088213R-ITCEP07V04 Page: 101 of 131 10.4. Test Procedure The EUT is placed on a table that is 0.8 meter height. A ground reference pla

Página 8 - Page: 5 of 131

Report No: 088213R-ITCEP07V04 Page: 102 of 131 10.6. Test Result Product Notebook Test Item Electrical fast transient/burst Test Mode Mode 1

Página 9 - Page: 6 of 131

Report No: 088213R-ITCEP07V04 Page: 103 of 131 Product Notebook Test Item Electrical fast transient/burst Test Mode Mode 2 Date of Test 200

Página 10 - 1.1. EUT Description

Report No: 088213R-ITCEP07V04 Page: 104 of 131 10.7. Test Photograph Test Mode : Mode 1 Description : EFT/B Test Setup Test Mode : Mode 1 Desc

Página 11 - Keyparts List

Report No: 088213R-ITCEP07V04 Page: 105 of 131 Test Mode : Mode 2 Description : EFT/B Test Setup Test Mode : Mode 2 Description : EFT/B Test S

Página 12

Report No: 088213R-ITCEP07V04 Page: 106 of 131 11. Surge 11.1. Test Specification According to Standard : IEC 61000-4-5 11.2. Test Setup 11

Página 13 - 1.2. Mode of Operation

Report No: 088213R-ITCEP07V04 Page: 8 of 131 Keyparts List ITEM Vendor M/N P8400/2.26G QZNM/2.4G CPU INTEL T9400/2.53 N156B3-L02 (15.6") C

Página 14 - Page: 11 of 131

Report No: 088213R-ITCEP07V04 Page: 107 of 131 11.4. Test Procedure The EUT and its load are placed on a table that is 0.8 meter above a metal gr

Página 15 - Page: 12 of 131

Report No: 088213R-ITCEP07V04 Page: 108 of 131 11.6. Test Result Product Notebook Test Item Surge Test Mode Mode 1 Date of Test 2008/08/27

Página 16 - Page: 13 of 131

Report No: 088213R-ITCEP07V04 Page: 109 of 131 Product Notebook Test Item Surge Test Mode Mode 2 Date of Test 2008/08/27 Test Site No.6 Sh

Página 17 - Page: 14 of 131

Report No: 088213R-ITCEP07V04 Page: 110 of 131 11.7. Test Photograph Test Mode : Mode 1 Description : SURGE Test Setup Test Mode : Mode 2 De

Página 18 - 1.3. Tested System Details

Report No: 088213R-ITCEP07V04 Page: 111 of 131 12. Conducted Susceptibility 12.1. Test Specification According to Standard : IEC 61000-4-6 12.2

Página 19

Report No: 088213R-ITCEP07V04 Page: 112 of 131 12.3. Limit Item Environmental Phenomena Units Test Specification Performance Criteria Signal Por

Página 20 - 1.5. EUT Exercise Software

Report No: 088213R-ITCEP07V04 Page: 113 of 131 12.6. Test Result Product Notebook Test Item Conducted susceptibility Test Mode Mode 1 Date o

Página 21 - 2.1. Summary of Test Result

Report No: 088213R-ITCEP07V04 Page: 114 of 131 Product Notebook Test Item Conducted susceptibility Test Mode Mode 2 Date of Test 2008/08/27

Página 22 - 2.2. List of Test Equipment

Report No: 088213R-ITCEP07V04 Page: 115 of 131 12.7. Test Photograph Test Mode : Mode 1 Description : Conducted Susceptibility Test Setup Test

Página 23

Report No: 088213R-ITCEP07V04 Page: 116 of 131 Test Mode : Mode 2 Description : Conducted Susceptibility Test Setup Test Mode : Mode 2 Descript

Página 24

Report No: 088213R-ITCEP07V04 Page: 9 of 131 LI SHIN LSE0202C1990 Adapter DELTA ADP-90SB BB Sumida IN1408/T-LF Inverter SAMPO YIVNMS0018D11-B

Página 25 - 2.3. Measurement Uncertainty

Report No: 088213R-ITCEP07V04 Page: 117 of 131 13. Power Frequency Magnetic Field 13.1. Test Specification According to Standard : IEC 61000-4-8

Página 26 - Page: 23 of 131

Report No: 088213R-ITCEP07V04 Page: 118 of 131 13.6. Test Result Product Notebook Test Item Power frequency magnetic field Test Mode Mode 1

Página 27 - 2.4. Test Environment

Report No: 088213R-ITCEP07V04 Page: 119 of 131 Product Notebook Test Item Power frequency magnetic field Test Mode Mode 2 Date of Test 2008

Página 28 - 3.3. Limit

Report No: 088213R-ITCEP07V04 Page: 120 of 131 13.7. Test Photograph Test Mode : Mode 1 Description : Power Frequency Magnetic Field Test Setu

Página 29 - 3.4. Test Procedure

Report No: 088213R-ITCEP07V04 Page: 121 of 131 14. Voltage Dips and Interruption 14.1. Test Specification According to Standard : IEC 61000-4-11

Página 30 - 3.6. Test Result

Report No: 088213R-ITCEP07V04 Page: 122 of 131 14.4. Test Procedure The EUT and its load are placed on a table which is 0.8 meter above a metal g

Página 31 - Page: 28 of 131

Report No: 088213R-ITCEP07V04 Page: 123 of 131 14.6. Test Result Product Notebook Test Item Voltage dips and interruption Test Mode Mode 1 D

Página 32 - Page: 29 of 131

Report No: 088213R-ITCEP07V04 Page: 124 of 131 Product Notebook Test Item Voltage dips and interruption Test Mode Mode 2 Date of Test 2008/0

Página 33 - Page: 30 of 131

Report No: 088213R-ITCEP07V04 Page: 125 of 131 14.7. Test Photograph Test Mode : Mode 1 Description : Voltage Dips Test Setup Test Mode : Mo

Página 34 - Page: 31 of 131

Report No: 088213R-ITCEP07V04 Page: 126 of 131 15. Attachment  EUT Photograph (1) EUT Photo (2) EUT Photo

Página 35 - Page: 32 of 131

Report No: 088213R-ITCEP07V04 Page: 10 of 131 1.2. Mode of Operation QuieTek has verified the construction and function in typical operation. All

Página 36 - Page: 33 of 131

Report No: 088213R-ITCEP07V04 Page: 127 of 131 (3) EUT Photo (4) EUT Photo

Página 37 - Page: 34 of 131

Report No: 088213R-ITCEP07V04 Page: 128 of 131 (5) EUT Photo (6) EUT Photo

Página 38 - Page: 35 of 131

Report No: 088213R-ITCEP07V04 Page: 129 of 131 (7) EUT Photo (8) EUT Photo

Página 39 - Page: 36 of 131

Report No: 088213R-ITCEP07V04 Page: 130 of 131 (9) EUT Photo (10) EUT Photo

Página 40 - Page: 37 of 131

Report No: 088213R-ITCEP07V04 Page: 131 of 131 (11) EUT Photo (12) EUT Photo

Página 41 - Page: 38 of 131

Report No: 088213R-ITCEP07V04 Page: 11 of 131 ITEM MODE1 MODE2 CPU INTEL T9400 / 2.53GHz INTEL QZNM / 2.4GHz Display/Resolution LCD+CRT/1366*7

Página 42 - 3.7. Test Photograph

Report No: 088213R-ITCEP07V04 Page: 12 of 131 ITEM MODE5 MODE6 CPU INTEL QZNM/2.4GHz INTEL P8400/2.26GHz Display/Resolution LCD+CRT/1366*768/6

Página 43

Report No: 088213R-ITCEP07V04 Page: 13 of 131 ITEM MODE9 MODE10 CPU INTEL P8400/2.26GHz INTEL T9400/2.53GHz Display/Resolution LCD+CRT/1366*768/

Página 44 - 4.3. Limit

Report No: 088213R-ITCEP07V04 Page: 14 of 131 ITEM MODE13 MODE14 CPU INTEL T9400/2.53GHz INTEL QZNM/2.4GHz Display/Resolution LCD+CRT/1366*768/6

Página 45 - 4.4. Test Procedure

Report No: 088213R-ITCEP07V04 Page: 15 of 131 1.3. Tested System Details The types for all equipments, plus descriptions of all cables used in the

Página 46 - 4.6. Test Result

Report No: 088213R-ITCEP07V04 Page: 16 of 131 1.4. Configuration of Tested System Connection Diagram Signal Cable Type Signal cable Description

Página 47 - Page: 44 of 131

Test Report Product Name:Notebook Model No. :MS-1674, EX620 Applicant : MICRO-STAR INT’L Co., LTD. Address : No. 69, Li-De St., Jun

Página 48 - Page: 45 of 131

Report No: 088213R-ITCEP07V04 Page: 17 of 131 1.5. EUT Exercise Software 1 Setup the EUT and simulators as shown on 1.4. 2 Turn on the power of

Página 49 - Page: 46 of 131

Report No: 088213R-ITCEP07V04 Page: 18 of 131 2. Technical Test 2.1. Summary of Test Result No deviations from the test standards Deviatio

Página 50 - Page: 47 of 131

Report No: 088213R-ITCEP07V04 Page: 19 of 131 2.2. List of Test Equipment Conducted Emission / SR1 Instrument Manufacturer Type No. Serial No

Página 51 - Page: 48 of 131

Report No: 088213R-ITCEP07V04 Page: 20 of 131 Electrostatic Discharge / SR3 Instrument Manufacturer Type No. Serial No Cal. Date ESD simulato

Página 52 - Page: 49 of 131

Report No: 088213R-ITCEP07V04 Page: 21 of 131 Voltage dips and interruption / SR6 Instrument Manufacturer Type No. Serial No Cal. Date EMC im

Página 53 - Page: 50 of 131

Report No: 088213R-ITCEP07V04 Page: 22 of 131 2.3. Measurement Uncertainty Conducted Emission The measurement uncertainty is evaluated as ± 2.26

Página 54 - Page: 51 of 131

Report No: 088213R-ITCEP07V04 Page: 23 of 131 Conducted susceptibility As what is concluded in the document from Note2 of clause 5.4.6.2 of ISO/IE

Página 55 - Page: 52 of 131

Report No: 088213R-ITCEP07V04 Page: 24 of 131 2.4. Test Environment Performed Item Items Required Actual Temperature (C) 15-35 25 Conducted

Página 56 - Page: 53 of 131

Report No: 088213R-ITCEP07V04 Page: 25 of 131 3. Conducted Emission (Main Terminals) 3.1. Test Specification According to EMC Standard : EN 5502

Página 57 - Page: 54 of 131

Report No: 088213R-ITCEP07V04 Page: 26 of 131 3.4. Test Procedure The EUT and simulators are connected to the main power through a line impedance

Página 58 - Page: 55 of 131

Declaration of Conformity The followin g product is herewith confirmed to comply with the requirement s set out in the Council Directive on the

Página 59 - Page: 56 of 131

Report No: 088213R-ITCEP07V04 Page: 27 of 131 3.6. Test Result Site : SR-1 Time : 2008/08/18 - 10:01 Limit : CISPR_B_00M_QP Margin : 10 EUT : No

Página 60 - Page: 57 of 131

Report No: 088213R-ITCEP07V04 Page: 28 of 131 Site : SR-1 Time : 2008/08/18 - 10:04 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : EN

Página 61 - Page: 58 of 131

Report No: 088213R-ITCEP07V04 Page: 29 of 131 Site : SR-1 Time : 2008/08/18 - 10:04 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : EN

Página 62 - Page: 59 of 131

Report No: 088213R-ITCEP07V04 Page: 30 of 131 Site : SR-1 Time : 2008/08/18 - 10:05 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : E

Página 63 - Page: 60 of 131

Report No: 088213R-ITCEP07V04 Page: 31 of 131 Site : SR-1 Time : 2008/08/18 - 10:07 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : EN

Página 64 - Page: 61 of 131

Report No: 088213R-ITCEP07V04 Page: 32 of 131 Site : SR-1 Time : 2008/08/18 - 10:07 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : EN

Página 65 - Page: 62 of 131

Report No: 088213R-ITCEP07V04 Page: 33 of 131 Site : SR-1 Time : 2008/08/18 - 11:34 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : E

Página 66 - Page: 63 of 131

Report No: 088213R-ITCEP07V04 Page: 34 of 131 Site : SR-1 Time : 2008/08/18 - 11:35 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : EN

Página 67 - Page: 64 of 131

Report No: 088213R-ITCEP07V04 Page: 35 of 131 Site : SR-1 Time : 2008/08/18 - 11:35 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : EN

Página 68 - Page: 65 of 131

Report No: 088213R-ITCEP07V04 Page: 36 of 131 Site : SR-1 Time : 2008/08/18 - 11:36 Limit : CISPR_B_00M_QP Margin : 10 EUT : Notebook Probe : E

Página 69 - Page: 66 of 131

QuieTek Corporation / No.5-22, Ruei-Shu Valley, Ruei-Ping Tsuen Lin Kou Shiang, Taipei 244 Taiwan, R.O.C. Tel: 886-2-8601-3788, Fax: 886-2-8601

Página 70 - 4.7. Test Photograph

Report No: 088213R-ITCEP07V04 Page: 37 of 131 Site : SR-1 Time : 2008/08/18 - 11:37 Limit : CISPR_B_00M_QP Margin : 0 EUT : Notebook Probe : EN

Página 71

Report No: 088213R-ITCEP07V04 Page: 38 of 131 Site : SR-1 Time : 2008/08/18 - 11:37 Limit : CISPR_B_00M_AV Margin : 0 EUT : Notebook Probe : EN

Página 72 - 5.3. Limit

Report No: 088213R-ITCEP07V04 Page: 39 of 131 3.7. Test Photograph Test Mode : Mode 1 Description : Front View of Conducted Test Test Mode

Página 73 - 5.4. Test Procedure

Report No: 088213R-ITCEP07V04 Page: 40 of 131 Test Mode : Mode 2 Description : Front View of Conducted Test Test Mode : Mode 2 Descriptio

Página 74 - Page: 71 of 131

Report No: 088213R-ITCEP07V04 Page: 41 of 131 4. Conducted Emissions (Telecommunication Ports) 4.1. Test Specification According to EMC Standard

Página 75 - Page: 72 of 131

Report No: 088213R-ITCEP07V04 Page: 42 of 131 4.4. Test Procedure Telecommunication Port: The mains voltage shall be supplied to the EUT via the L

Página 76 - Page: 73 of 131

Report No: 088213R-ITCEP07V04 Page: 43 of 131 4.6. Test Result Site : SR-1 Time : 2008/08/18 - 10:24 Limit : ISN_Voltage_B_00M_QP Margin : 10 EU

Página 77 - Page: 74 of 131

Report No: 088213R-ITCEP07V04 Page: 44 of 131 Site : SR-1 Time : 2008/08/18 - 10:25 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Página 78 - 5.7. Test Photograph

Report No: 088213R-ITCEP07V04 Page: 45 of 131 Site : SR-1 Time : 2008/08/18 - 10:25 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Página 79

Report No: 088213R-ITCEP07V04 Page: 46 of 131 Site : SR-1 Time : 2008/08/18 - 10:11 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Página 80 - 6.3. Limit

Report No: 088213R-ITCEP07V04 Page: 2 of 131 Test Report Certification Issued Date : 2008/08/27 Report No. : 088213R-

Página 81 - Page: 78 of 131

Report No: 088213R-ITCEP07V04 Page: 47 of 131 Site : SR-1 Time : 2008/08/18 - 10:13 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Página 82 - 6.4. Test Procedure

Report No: 088213R-ITCEP07V04 Page: 48 of 131 Site : SR-1 Time : 2008/08/18 - 10:13 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Página 83 - 6.6. Test Result

Report No: 088213R-ITCEP07V04 Page: 49 of 131 Site : SR-1 Time : 2008/08/18 - 10:15 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Página 84

Report No: 088213R-ITCEP07V04 Page: 50 of 131 Site : SR-1 Time : 2008/08/18 - 10:16 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Página 85 - Test Mode Mode 2

Report No: 088213R-ITCEP07V04 Page: 51 of 131 Site : SR-1 Time : 2008/08/18 - 10:16 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Página 86

Report No: 088213R-ITCEP07V04 Page: 52 of 131 Site : SR-1 Time : 2008/08/18 - 10:18 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Página 87 - 6.7. Test Photograph

Report No: 088213R-ITCEP07V04 Page: 53 of 131 Site : SR-1 Time : 2008/08/18 - 10:20 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Página 88 - 7.3. Limit

Report No: 088213R-ITCEP07V04 Page: 54 of 131 Site : SR-1 Time : 2008/08/18 - 10:20 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Página 89 - 7.4. Test Procedure

Report No: 088213R-ITCEP07V04 Page: 55 of 131 Site : SR-1 Time : 2008/08/18 - 11:48 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pr

Página 90 - 7.6. Test Result

Report No: 088213R-ITCEP07V04 Page: 56 of 131 Site : SR-1 Time : 2008/08/18 - 11:49 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Página 91

Report No: 088213R-ITCEP07V04 Page: 3 of 131 Laboratory Information We , QuieTek Corporation, are an independent EMC and safety consultancy that wa

Página 92 - 7.7. Test Photograph

Report No: 088213R-ITCEP07V04 Page: 57 of 131 Site : SR-1 Time : 2008/08/18 - 11:49 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Página 93 - 8.3. Limit

Report No: 088213R-ITCEP07V04 Page: 58 of 131 Site : SR-1 Time : 2008/08/18 - 11:46 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Página 94 - 8.4. Test Procedure

Report No: 088213R-ITCEP07V04 Page: 59 of 131 Site : SR-1 Time : 2008/08/18 - 11:47 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Página 95 - Page: 92 of 131

Report No: 088213R-ITCEP07V04 Page: 60 of 131 Site : SR-1 Time : 2008/08/18 - 11:47 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Página 96 - Page: 93 of 131

Report No: 088213R-ITCEP07V04 Page: 61 of 131 Site : SR-1 Time : 2008/08/18 - 11:44 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Página 97 - 8.7. Test Photograph

Report No: 088213R-ITCEP07V04 Page: 62 of 131 Site : SR-1 Time : 2008/08/18 - 11:45 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Página 98 - 9.3. Limit

Report No: 088213R-ITCEP07V04 Page: 63 of 131 Site : SR-1 Time : 2008/08/18 - 11:45 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Página 99 - 9.4. Test Procedure

Report No: 088213R-ITCEP07V04 Page: 64 of 131 Site : SR-1 Time : 2008/08/18 - 11:42 Limit : ISN_Voltage_B_00M_QP Margin : 10 EUT : Notebook Pro

Página 100 - Page: 97 of 131

Report No: 088213R-ITCEP07V04 Page: 65 of 131 Site : SR-1 Time : 2008/08/18 - 11:43 Limit : ISN_Voltage_B_00M_QP Margin : 0 EUT : Notebook Prob

Página 101 - Page: 98 of 131

Report No: 088213R-ITCEP07V04 Page: 66 of 131 Site : SR-1 Time : 2008/08/18 - 11:43 Limit : ISN_Voltage_B_00M_AV Margin : 0 EUT : Notebook Prob

Página 102 - 9.7. Test Photograph

Report No: 088213R-ITCEP07V04 Page: 4 of 131 TABLE OF CONTENTS Description Page 1.

Página 103 - 10.2. Test Setup

Report No: 088213R-ITCEP07V04 Page: 67 of 131 4.7. Test Photograph Test Mode : Mode 1 Description : Front View of ISN Test Test Mode : Mo

Página 104 - 10.4. Test Procedure

Report No: 088213R-ITCEP07V04 Page: 68 of 131 Test Mode : Mode 2 Description : Front View of ISN Test Test Mode : Mode 2 Description :

Página 105 - Page: 102 of 131

Report No: 088213R-ITCEP07V04 Page: 69 of 131 5. Radiated Emission 5.1. Test Specification According to EMC Standard : EN 55022 5.2. Test Setu

Página 106 - Page: 103 of 131

Report No: 088213R-ITCEP07V04 Page: 70 of 131 5.4. Test Procedure The EUT and its simulators are placed on a turn table which is 0.8 meter above g

Página 107 - 10.7. Test Photograph

Report No: 088213R-ITCEP07V04 Page: 71 of 131 5.6. Test Result Site : OATS-3 Time : 2008/08/20 - 05:25 Limit : CISPR_B_10M_QP Margin : 6 EUT : N

Página 108

Report No: 088213R-ITCEP07V04 Page: 72 of 131 Site : OATS-3 Time : 2008/08/20 - 05:18 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe :

Página 109 - 11.3. Limit

Report No: 088213R-ITCEP07V04 Page: 73 of 131 Site : OATS-3 Time : 2008/08/20 - 05:59 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe :

Página 110 - 11.4. Test Procedure

Report No: 088213R-ITCEP07V04 Page: 74 of 131 Site : OATS-3 Time : 2008/08/20 - 05:52 Limit : CISPR_B_10M_QP Margin : 6 EUT : Notebook Probe :

Página 111 - Page: 108 of 131

Report No: 088213R-ITCEP07V04 Page: 75 of 131 5.7. Test Photograph Test Mode : Mode 1 Description : Front View of Radiated Test Test Mode

Página 112 - Page: 109 of 131

Report No: 088213R-ITCEP07V04 Page: 76 of 131 Test Mode : Mode 2 Description : Front View of Radiated Test Test Mode : Mode 2 Descriptio

Página 113 - 11.7. Test Photograph

Report No: 088213R-ITCEP07V04 Page: 5 of 131 6.1. Test Specification ...

Página 114 - 12.2. Test Setup

Report No: 088213R-ITCEP07V04 Page: 77 of 131 6. Harmonic Current Emission 6.1. Test Specification According to EMC Standard : EN 61000-3-2 6.2

Página 115 - 12.4. Test Procedure

Report No: 088213R-ITCEP07V04 Page: 78 of 131 (b) Limits of Class B Harmonics Currents For Class B equipment, the harmonic of the input current s

Página 116 - Page: 113 of 131

Report No: 088213R-ITCEP07V04 Page: 79 of 131 6.4. Test Procedure The EUT is supplied in series with power analyzer from a power source having the

Página 117 - Page: 114 of 131

Report No: 088213R-ITCEP07V04 Page: 80 of 131 6.6. Test Result Product Notebook Test Item Power Harmonics Test Mode Mode 1 Date of Test 2008

Página 118 - 12.7. Test Photograph

Report No: 088213R-ITCEP07V04 Page: 81 of 131 Test Result: Pass Source qualification: Normal THC(A): 0.00 I-THD(%): 0.00 PO

Página 119

Report No: 088213R-ITCEP07V04 Page: 82 of 131 Product Notebook Test Item Power Harmonics Test Mode Mode 2 Date of Test 2008/08/27 Test Site

Página 120 - Page: 117 of 131

Report No: 088213R-ITCEP07V04 Page: 83 of 131 Test Result: Pass Source qualification: Normal THC(A): 0.13 I-THD(%): 47.88 P

Página 121 - Page: 118 of 131

Report No: 088213R-ITCEP07V04 Page: 84 of 131 6.7. Test Photograph Test Mode : Mode 1 Description : Power Harmonics Test Setup Test Mode

Página 122 - Page: 119 of 131

Report No: 088213R-ITCEP07V04 Page: 85 of 131 7. Voltage Fluctuation and Flicker 7.1. Test Specification According to EMC Standard : EN 61000-3

Página 123 - 13.7. Test Photograph

Report No: 088213R-ITCEP07V04 Page: 86 of 131 c) 7 % for equipment which is: - attended whilst in use (for example: hair dryers, vacuum cleaners,

Página 124 - 14.3. Limit

Report No: 088213R-ITCEP07V04 Page: 6 of 131 10.7. Test Photograph ...

Página 125 - 14.4. Test Procedure

Report No: 088213R-ITCEP07V04 Page: 87 of 131 7.6. Test Result Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode Mode 1 Da

Página 126 - Page: 123 of 131

Report No: 088213R-ITCEP07V04 Page: 88 of 131 Product Notebook Test Item Voltage Fluctuation and Flicker Test Mode Mode 2 Date of Test 2008/

Página 127 - Page: 124 of 131

Report No: 088213R-ITCEP07V04 Page: 89 of 131 7.7. Test Photograph Test Mode : Mode 1 Description : Flicker Test Setup Test Mode : Mode 2

Página 128 - 14.7. Test Photograph

Report No: 088213R-ITCEP07V04 Page: 90 of 131 8. Electrostatic Discharge 8.1. Test Specification According to Standard : IEC 61000-4-2 8.2. Tes

Página 129 -  EUT Photograph

Report No: 088213R-ITCEP07V04 Page: 91 of 131 8.4. Test Procedure Direct application of discharges to the EUT: Contact discharge was applied only

Página 130 - (4) EUT Photo

Report No: 088213R-ITCEP07V04 Page: 92 of 131 8.6. Test Result Product Notebook Test Item Electrostatic Discharge Test Mode Mode 1 Date of Te

Página 131 - (6) EUT Photo

Report No: 088213R-ITCEP07V04 Page: 93 of 131 Product Notebook Test Item Electrostatic Discharge Test Mode Mode 2 Date of Test 2008/08/27 T

Página 132 - (8) EUT Photo

Report No: 088213R-ITCEP07V04 Page: 94 of 131 8.7. Test Photograph Test Mode : Mode 1 Description : ESD Test Setup Test Mode : Mode 2 Descr

Página 133 - (10) EUT Photo

Report No: 088213R-ITCEP07V04 Page: 95 of 131 9. Radiated Susceptibility 9.1. Test Specification According to Standard : IEC 61000-4-3 9.2. Test

Página 134 - (12) EUT Photo

Report No: 088213R-ITCEP07V04 Page: 96 of 131 9.4. Test Procedure The EUT and load, which are placed on a table that is 0.8 meter above ground, ar

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